Workshop on Measurement Methods for Signal/Power Integrity and Active Devices and Circuits Characterization
A successful one-day workshop entitled “Measurement Methods for Signal/Power Integrity and Active Devices and Circuits Characterization” was held on Wednesday, 3rd July 2024, at Sapienza University of Rome in Italy. It was jointly organized by Faisal Mubarak from VSL, The Netherlands, Djamel Allal from Laboratoire national de métrologie et d’essais, France, and Gianfranco Miele from the University of Cassino and Southern Lazio, Italy under the umbrella of the 2024 IEEE International Symposium on Measurement and Networking.
This workshop was organized under Work Packages 1 and 2 of the FutureCom project, and it was attended by several participants from both industry and academia. The morning session proposed methods, recommendations, and guidelines for power and signal integrity characterization of FPGA boards and on-wafer structures. In the afternoon session, the characterization of the non-linear behavior of high-power GaN FETs, the metrological analysis of the random variation of the controlled reflection coefficient in mixed-signal load-pull test benches, and a novel coaxial on-wafer probe were also disseminated to the audience. Further to that, there were two panel sessions, where in-depth discussions were held on the results, and very constructive feedback was received from the participants.
