{"id":4720,"date":"2023-11-28T13:31:21","date_gmt":"2023-11-28T13:31:21","guid":{"rendered":"https:\/\/futurecom.unicas.it\/?page_id=4720"},"modified":"2024-10-07T13:37:31","modified_gmt":"2024-10-07T13:37:31","slug":"journal-papers","status":"publish","type":"page","link":"https:\/\/futurecom.unicas.it\/?page_id=4720","title":{"rendered":"Journal papers"},"content":{"rendered":"\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-kylekjx9-f4a78f4296454450836f921e674ba6fb\">\n.avia-image-container.av-kylekjx9-f4a78f4296454450836f921e674ba6fb .av-image-caption-overlay-center{\ncolor:#ffffff;\n}\n<\/style>\n<div  class='avia-image-container av-kylekjx9-f4a78f4296454450836f921e674ba6fb av-styling- avia-align-center  avia-builder-el-0  el_before_av_heading  avia-builder-el-first  '  itemprop=\"image\" itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/ImageObject\" ><div class=\"avia-image-container-inner\"><div class=\"avia-image-overlay-wrap\"><img fetchpriority=\"high\" fetchpriority=\"high\" decoding=\"async\" class='wp-image-4703 avia-img-lazy-loading-not-4703 avia_image' src=\"https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_4.jpg\" alt='' title=''  height=\"423\" width=\"1210\"  itemprop=\"thumbnailUrl\" srcset=\"https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_4.jpg 1210w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_4-300x105.jpg 300w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_4-1024x358.jpg 1024w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_4-768x268.jpg 768w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_4-705x246.jpg 705w\" sizes=\"(max-width: 1210px) 100vw, 1210px\" \/><\/div><\/div><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-kyohfi4n-96f650e9bc0dbd015272e3d636986cfe\">\n#top .av-special-heading.av-kyohfi4n-96f650e9bc0dbd015272e3d636986cfe{\npadding-bottom:10px;\n}\n<\/style>\n<div  class='av-special-heading av-kyohfi4n-96f650e9bc0dbd015272e3d636986cfe av-special-heading-h3  avia-builder-el-1  el_after_av_image  el_before_av_section  avia-builder-el-last  '><h3 class='av-special-heading-tag '  itemprop=\"headline\"  >Journal papers<\/h3><div class='special-heading-border'><div class='special-heading-inner-border'><\/div><\/div><\/div>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_1'  class='avia-section av-kyej8t8v-77601e3768a60f9e6b05ff81ffae07e1 main_color avia-section-large avia-no-shadow  avia-builder-el-2  el_after_av_heading  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4720'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-gxcsrm-1ce9f00270d77785cb34798eb06fe95a av_three_fifth  avia-builder-el-3  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"overview\"  class='av_textblock_section av-kyeiwjak-f01912c9242bddac9e517e8a928abb20 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>Phung, G. N. and Arz, U.: Modeling and Analytical Description of Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides, Adv. Radio Sci., 20, 119\u2013129, https:\/\/doi.org\/10.5194\/ars-20-119-2023, 2023.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-j8oevm-460a1ad959ad293b1711195f70772a38 av_one_fifth  avia-builder-el-5  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpiakvxf-57c44c6b7d9122d5652a5812113d45a6\">\n.av_font_icon.av-lpiakvxf-57c44c6b7d9122d5652a5812113d45a6 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpiakvxf-57c44c6b7d9122d5652a5812113d45a6 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ars.copernicus.org\/articles\/20\/119\/2023\/ars-20-119-2023.pdf' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpiaikpz-7cf67af12bb4a676b15abd8bc5777953 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ars.copernicus.org\/articles\/20\/119\/2023\/ars-20-119-2023.pdf\" target=\"_blank\" rel=\"noopener\">open-access paper<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-sdxsmz-b2d5aa0e45a93ad69c3b8b636917edf4 av_one_fifth  avia-builder-el-8  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_2'  class='avia-section av-kyej8jt8-0174f3a35905580ceaab4b76d54d9460 alternate_color avia-section-large avia-no-shadow  avia-builder-el-9  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4720'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-f6gkf6-838fd6858b4212e6148e61b52eccfd68 av_three_fifth  avia-builder-el-10  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kyej5hi8-be9b4fdf7147489780c94079462b0d49 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>G. N. Phung, U. Arz and W. Heinrich, &#8220;Precise Modeling of Coplanar Device Measurements Under Realistic Conditions up to G-Band,&#8221; in\u00a0<em>IEEE Transactions on Components, Packaging and Manufacturing Technology<\/em>, vol. 13, no. 10, pp. 1584-1590, Oct. 2023, doi: 10.1109\/TCPMT.2023.3294620.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-rdm50r-f055a49b37f5a98b9bc0378dccd2d4d9 av_one_fifth  avia-builder-el-12  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1z23nhq-ea3e350cb85527f9f5327a00a7ae1623\">\n.av_font_icon.av-m1z23nhq-ea3e350cb85527f9f5327a00a7ae1623 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1z23nhq-ea3e350cb85527f9f5327a00a7ae1623 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13898835' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1z23uf9-aa5781f0e4f4bdeb533b867b82559724 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13898835\" target=\"_blank\" rel=\"noopener\">open-access paper<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-pglkkr-cb67e2a6e0a06a0f5076cb5c9eca0675 av_one_fifth  avia-builder-el-15  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpidbr5s-c3807b8dbd29082c901c07d10b1482f2\">\n.av_font_icon.av-lpidbr5s-c3807b8dbd29082c901c07d10b1482f2 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpidbr5s-c3807b8dbd29082c901c07d10b1482f2 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10180087' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpidbyyf-1007579d7b34a8d1f8349b76a23e9764 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10180087\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_3'  class='avia-section av-kyejg23r-48ae7ed5315a4e31b7879f3616ca1f75 main_color avia-section-large avia-no-shadow  avia-builder-el-18  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4720'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-ngumgr-325b83e207669769ecf8b062f13b7db6 av_three_fifth  avia-builder-el-19  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-lpic2lug-30b42da5833893e65980a74257de71ef '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>M. Garc\u00eda-Patr\u00f3n, M. Rodr\u00edguez, J. A. Ruiz-Cruz and I. Montero, &#8220;Uncertainty Budget in Microwave High-Power Testing,&#8221; in\u00a0<em>IEEE Transactions on Instrumentation and Measurement<\/em>, vol. 72, pp. 1-12, 2023, Art no. 1009512, doi: 10.1109\/TIM.2023.3317909.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-n57ll7-804925b4ad24bc7c893ddf917c8b29c5 av_one_fifth  avia-builder-el-21  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpidf4kh-276f2ef58b3e7ad37a622e655d7cff68\">\n.av_font_icon.av-lpidf4kh-276f2ef58b3e7ad37a622e655d7cff68 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpidf4kh-276f2ef58b3e7ad37a622e655d7cff68 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/stamp\/stamp.jsp?tp=&arnumber=10261456' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpidfg3b-a8706f998e514fd24632814a4f9eeff7 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/stamp\/stamp.jsp?tp=&#038;arnumber=10261456\" target=\"_blank\" rel=\"noopener\">open-access paper<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-l377dn-6509d3c2e1b988a4feda56f95e0704ba av_one_fifth  avia-builder-el-24  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n<\/p>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_4'  class='avia-section av-zy3o0y-ecfde4569871e77192afbc93cbe55267 alternate_color avia-section-large avia-no-shadow  avia-builder-el-25  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4720'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-y1ddya-7fcecd85f3ba0bd2b66c7367480e64e4 av_three_fifth  avia-builder-el-26  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kylmhfcj-eaf8fa7832657bf5e76f04ca6b646e4f '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>D. Singh, M. J. Salter, S. Johny and N. M. Ridler, &#8220;Uncertainties in Small-Signal and Large-Signal Measurements of RF Amplifiers Using a VNA,&#8221; in\u00a0<em>IEEE Instrumentation &#038; Measurement Magazine<\/em>, vol. 25, no. 6, pp. 37-44, September 2022, doi: 10.1109\/MIM.2022.9847190.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-igqkjf-5e8522daa16671fdb799b730329b0d64 av_one_fifth  avia-builder-el-28  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lsvi3gis-aed0332a167f8641f5302b6e8ef17909\">\n.av_font_icon.av-lsvi3gis-aed0332a167f8641f5302b6e8ef17909 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lsvi3gis-aed0332a167f8641f5302b6e8ef17909 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/records\/10683173' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lsvi3rfc-c41c2bc0014bb653886bd042cbddd710 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/records\/10683173\" target=\"_blank\" rel=\"noopener\">open-access paper<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-i2xj0r-01c508c37ab5f3290c1923b60739a36c av_one_fifth  avia-builder-el-31  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpidkwxm-a48c3c07527d85822c176955054e8824\">\n.av_font_icon.av-lpidkwxm-a48c3c07527d85822c176955054e8824 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpidkwxm-a48c3c07527d85822c176955054e8824 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/9847190' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpidl4ax-8cae013da50cdff33395bf28d6401a71 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/9847190\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_5'  class='avia-section av-7n72vk-f494adbbae23ad9a66c59fe2bd17f0ff main_color avia-section-large avia-no-shadow  avia-builder-el-34  el_after_av_section  avia-builder-el-last  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4720'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-69mqrk-f938c7fa7d478181bdd435eb53e2b4ed av_three_fifth  avia-builder-el-35  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1ucim1h-70b52cf641b18b7bb52bbf818aeb09a8 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>K. Lahbacha\u00a0<em>et al<\/em>., &#8220;Guidelines for the Design of Thin Film Microstrip Lines for Signal Integrity Analysis,&#8221; in\u00a0<em>IEEE Transactions on Components, Packaging and Manufacturing Technology<\/em>, doi: 10.1109\/TCPMT.2024.3473533<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-3v0dyo-abcc9dce45c5bfa1761b8334b9940f6d av_one_fifth  avia-builder-el-37  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1ucj71u-cac8736cd015f4154058a4f652160a47\">\n.av_font_icon.av-m1ucj71u-cac8736cd015f4154058a4f652160a47 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1ucj71u-cac8736cd015f4154058a4f652160a47 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10704759\/' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1ucjhcf-b4aa779d44548e1f6a21292beac5ba9a '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10704759\/\" target=\"_blank\" rel=\"noopener\">open-access paper<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-b0em8-4b564951e87453cc3a29ed111bec39cf av_one_fifth  avia-builder-el-40  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='after_section_5'  class='main_color av_default_container_wrap container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4720'><div class='entry-content-wrapper clearfix'>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-4720","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages\/4720","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=4720"}],"version-history":[{"count":5,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages\/4720\/revisions"}],"predecessor-version":[{"id":4880,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages\/4720\/revisions\/4880"}],"wp:attachment":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=4720"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}