{"id":4699,"date":"2023-11-28T13:13:19","date_gmt":"2023-11-28T13:13:19","guid":{"rendered":"https:\/\/futurecom.unicas.it\/?page_id=4699"},"modified":"2024-10-09T13:59:24","modified_gmt":"2024-10-09T13:59:24","slug":"conference-proceedings","status":"publish","type":"page","link":"https:\/\/futurecom.unicas.it\/?page_id=4699","title":{"rendered":"Conference Proceedings"},"content":{"rendered":"\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-kylekjx9-8345c90547c19f29b29540611b40c6d6\">\n.avia-image-container.av-kylekjx9-8345c90547c19f29b29540611b40c6d6 .av-image-caption-overlay-center{\ncolor:#ffffff;\n}\n<\/style>\n<div  class='avia-image-container av-kylekjx9-8345c90547c19f29b29540611b40c6d6 av-styling- avia-align-center  avia-builder-el-0  el_before_av_heading  avia-builder-el-first  '  itemprop=\"image\" itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/ImageObject\" ><div class=\"avia-image-container-inner\"><div class=\"avia-image-overlay-wrap\"><img fetchpriority=\"high\" fetchpriority=\"high\" decoding=\"async\" class='wp-image-4702 avia-img-lazy-loading-not-4702 avia_image' src=\"https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_3.jpg\" alt='' title=''  height=\"423\" width=\"1210\"  itemprop=\"thumbnailUrl\" srcset=\"https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_3.jpg 1210w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_3-300x105.jpg 300w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_3-1024x358.jpg 1024w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_3-768x268.jpg 768w, https:\/\/futurecom.unicas.it\/wp-content\/uploads\/2023\/11\/pubblicazioni_3-705x246.jpg 705w\" sizes=\"(max-width: 1210px) 100vw, 1210px\" \/><\/div><\/div><\/div>\n\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-kyohfi4n-a2008f8256259d7b961c6ce7c8db20ba\">\n#top .av-special-heading.av-kyohfi4n-a2008f8256259d7b961c6ce7c8db20ba{\npadding-bottom:10px;\n}\n<\/style>\n<div  class='av-special-heading av-kyohfi4n-a2008f8256259d7b961c6ce7c8db20ba av-special-heading-h3  avia-builder-el-1  el_after_av_image  el_before_av_section  avia-builder-el-last  '><h3 class='av-special-heading-tag '  itemprop=\"headline\"  >Conference Proceedings<\/h3><div class='special-heading-border'><div class='special-heading-inner-border'><\/div><\/div><\/div>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_1'  class='avia-section av-kyej8t8v-77601e3768a60f9e6b05ff81ffae07e1 main_color avia-section-large avia-no-shadow  avia-builder-el-2  el_after_av_heading  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-gxcsrm-1ce9f00270d77785cb34798eb06fe95a av_three_fifth  avia-builder-el-3  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"overview\"  class='av_textblock_section av-kyeiwjak-f01912c9242bddac9e517e8a928abb20 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>D. Allal\u00a0<em>et al<\/em>., &#8220;RF Measurements for Future Communication Applications: an Overview,&#8221;\u00a0<em>2022 IEEE International Symposium on Measurements &#038; Networking (M&#038;N)<\/em>, Padua, Italy, 2022, pp. 1-6, doi: 10.1109\/MN55117.2022.9887740.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-j8oevm-460a1ad959ad293b1711195f70772a38 av_one_fifth  avia-builder-el-5  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpiakvxf-297b9ea6f818fdc41127e4a92de5722b\">\n.av_font_icon.av-lpiakvxf-297b9ea6f818fdc41127e4a92de5722b .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpiakvxf-297b9ea6f818fdc41127e4a92de5722b avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/records\/7899778' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpiaikpz-7cf67af12bb4a676b15abd8bc5777953 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/records\/7899778\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-sdxsmz-b2d5aa0e45a93ad69c3b8b636917edf4 av_one_fifth  avia-builder-el-8  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpiarms5-46d57e066b085ce771d6cbd0068e6d2f\">\n.av_font_icon.av-lpiarms5-46d57e066b085ce771d6cbd0068e6d2f .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpiarms5-46d57e066b085ce771d6cbd0068e6d2f avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/9887740' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpiaiw6e-a0927b02778f579873fdf02fb2858d6b '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/9887740\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_2'  class='avia-section av-kyej8jt8-0174f3a35905580ceaab4b76d54d9460 alternate_color avia-section-large avia-no-shadow  avia-builder-el-11  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-f6gkf6-838fd6858b4212e6148e61b52eccfd68 av_three_fifth  avia-builder-el-12  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kyej5hi8-be9b4fdf7147489780c94079462b0d49 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>Sayegh A., Gellersen F., Stein F., Kuhlmann K., &#8220;Evaluation and Comparison of PIM Measurement Uncertainty using Different Methods,&#8221; International Workshop on Multipactor, Corona and Passive Intermodulation (MULCOPIM 2022), doi:10.7795\/810.20221118<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-rdm50r-f055a49b37f5a98b9bc0378dccd2d4d9 av_one_fifth  avia-builder-el-14  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpibvi5b-8e980734ce328380d92e342203cd8aa7\">\n.av_font_icon.av-lpibvi5b-8e980734ce328380d92e342203cd8aa7 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpibvi5b-8e980734ce328380d92e342203cd8aa7 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/oar.ptb.de\/resources\/show\/10.7795\/810.20221118' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpibvpfm-4527e8d6b47dedd4290e68eb7eb966bf '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/oar.ptb.de\/resources\/show\/10.7795\/810.20221118\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-pglkkr-cb67e2a6e0a06a0f5076cb5c9eca0675 av_one_fifth  avia-builder-el-17  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_3'  class='avia-section av-kyejg23r-48ae7ed5315a4e31b7879f3616ca1f75 main_color avia-section-large avia-no-shadow  avia-builder-el-18  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-ngumgr-325b83e207669769ecf8b062f13b7db6 av_three_fifth  avia-builder-el-19  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-lpic2lug-30b42da5833893e65980a74257de71ef '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>F. Mubarak, C.D. Martino, R. Toskovic, G. Rietveld, and M. Spirito, \u201cVNA-based power sensor calibration\u201d,<em>Conference on precision electromagnetic measurements (CPEM 2022),<\/em>\u00a0New Zealand.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-n57ll7-804925b4ad24bc7c893ddf917c8b29c5 av_one_fifth  avia-builder-el-21  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><\/div><div class='flex_column av-l377dn-6509d3c2e1b988a4feda56f95e0704ba av_one_fifth  avia-builder-el-22  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_4'  class='avia-section av-zy3o0y-ecfde4569871e77192afbc93cbe55267 alternate_color avia-section-large avia-no-shadow  avia-builder-el-23  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-y1ddya-7fcecd85f3ba0bd2b66c7367480e64e4 av_three_fifth  avia-builder-el-24  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kylmhfcj-eaf8fa7832657bf5e76f04ca6b646e4f '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>Pham T.-D., Ngoc Phung G., Lahbacha K., Maffucci A., Miele G., Arz U. and Allal D., \u201cOn-wafer test structures for the evaluation of signal integrity and power integrity at chip level\u201d, <em>Conference on precision electromagnetic measurements (CPEM 2022)<\/em>, Wellington, New Zealand,\u00a0<strong>12-16 December 2022<\/strong>.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-igqkjf-5e8522daa16671fdb799b730329b0d64 av_one_fifth  avia-builder-el-26  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><\/div><div class='flex_column av-i2xj0r-01c508c37ab5f3290c1923b60739a36c av_one_fifth  avia-builder-el-27  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_5'  class='avia-section av-u4e5ma-04c96d6b581e2666896e936080e354a6 main_color avia-section-large avia-no-shadow  avia-builder-el-28  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-s2sz8y-8797ad22c594739993cc317f3a4c9309 av_three_fifth  avia-builder-el-29  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"objectives\"  class='av_textblock_section av-kylmkcwd-8e0d3ea18948b936c14905b5f1ab57d1 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>Allal D., Ouameur M., Kuhlmann K. and Stein F., \u201cTraceable scattering parameter measurement in 4.3-10 coaxial line\u201d, <em>Conference on precision electromagnetic measurements (CPEM 2022)<\/em>, Wellington, New Zealand,\u00a0<strong>12-16 December 2022<\/strong>.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-fznhaj-b838da9f5a190ef80f768327c53c6f75 av_one_fifth  avia-builder-el-31  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><\/div><div class='flex_column av-1f2nwb-1d220b37cf398b4e78abf4a9dae1dfbc av_one_fifth  avia-builder-el-32  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_6'  class='avia-section av-qcjoiq-73a3f0f88303e8ac2ac886e666a1810e alternate_color avia-section-large avia-no-shadow  avia-builder-el-33  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-2cu58i-f3bd4a6b8cb2aa7b9769ea2553f26514 av_three_fifth  avia-builder-el-34  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kylmot6s-971ffdf7b6e77b485071afe4ed8f4120 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>F. Mubarak, F. Munoz, G. Rietveld, and M. Spirito, \u201cA Receiver-based RF Attenuation Measurement System,\u201d<em> Conference on precision electromagnetic measurements (CPEM 2022)<\/em>, Wellington, New Zealand,\u00a0<strong>12-16 December 2022<\/strong>.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-280yo2-ada551dc57d4252b8287b2c5265b1e6b av_one_fifth  avia-builder-el-36  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><\/div><div class='flex_column av-1b3257-9ddd0f392381cd4ee28dbf64a0a46bd4 av_one_fifth  avia-builder-el-37  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_7'  class='avia-section av-l51mz6-a7138045e6f3cfc07b1e55232d23db3e main_color avia-section-large avia-no-shadow  avia-builder-el-38  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-gyutwy-0edf038481f691fe468b8a5120050ba7 av_three_fifth  avia-builder-el-39  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"objectives\"  class='av_textblock_section av-kylmsgpf-b218ac9bd0656c39c6a25a90be9ef3f7 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>G. N. Phung\u00a0<em>et al<\/em>., &#8220;Recommendations for the Design of Differential Thin-Film Microstrip Lines,&#8221;\u00a0<em>2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)<\/em>, Aveiro, Portugal, 2023, pp. 1-4, doi: 10.1109\/SPI57109.2023.10145555.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-b7xfa3-abc09b7725fcf72f6e634d2a3a1d3b70 av_one_fifth  avia-builder-el-41  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lroqsplw-faf8babc71ea06239211d3974270c7bf\">\n.av_font_icon.av-lroqsplw-faf8babc71ea06239211d3974270c7bf .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lroqsplw-faf8babc71ea06239211d3974270c7bf avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/records\/10548539' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lroqsf72-7741c94e1dedf0cbf115678d0ba2cf72 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/records\/10548539\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-vc56z-89ec6831819f4439aab68a6f0cdec73e av_one_fifth  avia-builder-el-44  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpicn35z-a60c26733be87ecac0636ee53fdb6587\">\n.av_font_icon.av-lpicn35z-a60c26733be87ecac0636ee53fdb6587 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpicn35z-a60c26733be87ecac0636ee53fdb6587 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10145555' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpicnegv-4255a256c5427a42708e3721c2838d52 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10145555\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_8'  class='avia-section av-fw1d9u-175a1ea5c449514a95806a10075a5f50 alternate_color avia-section-large avia-no-shadow  avia-builder-el-47  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-1dbfaa-9e5226364e769c59af0d2b67631d0e80 av_three_fifth  avia-builder-el-48  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kyln1fi5-460381131311f6022e66a32271427373 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>K. Lahbacha\u00a0<em>et al<\/em>., &#8220;Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines (TFMSLs),&#8221;\u00a0<em>2023 IEEE 27th Workshop on Signal and Power Integrity (SPI)<\/em>, Aveiro, Portugal, 2023, pp. 1-4, doi: 10.1109\/SPI57109.2023.10145525.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-cz9aiq-5ba880dbefa191cc359ce9439e931445 av_one_fifth  avia-builder-el-50  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lrq1uvvu-99f4f559f9a991991b1fb4b76c11faa6\">\n.av_font_icon.av-lrq1uvvu-99f4f559f9a991991b1fb4b76c11faa6 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lrq1uvvu-99f4f559f9a991991b1fb4b76c11faa6 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/records\/10548983' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lrq1ukt9-c36a7f623c545135a8105d7c871fbdb2 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/records\/10548983\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-6wmaez-ea79f2ec1967b898dbe4647d45b48f38 av_one_fifth  avia-builder-el-53  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpicseg1-3127f4b0bdcd1b8e5eb9a355245d8a20\">\n.av_font_icon.av-lpicseg1-3127f4b0bdcd1b8e5eb9a355245d8a20 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpicseg1-3127f4b0bdcd1b8e5eb9a355245d8a20 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10145525' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpicsnb5-0f6cf584757e958947c320c409d0ba62 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10145525\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_9'  class='avia-section av-ar7rya-3b337212a661131ee6ab821e7c66e60f main_color avia-section-large avia-no-shadow  avia-builder-el-56  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-6c86y3-9731ba14bc992b7c7815ad2ec8a9d67d av_three_fifth  avia-builder-el-57  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"objectives\"  class='av_textblock_section av-kyln4fpk-4a8c0b747a8d4c57a4beca076bcd673d '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>U. Arz, G. N. Phung and A. Rumiantsev, &#8220;Traceable Lumped-Element Calibrations up to 110 GHz on Commercial Calibration Substrates,&#8221;\u00a0<em>2023 100th ARFTG Microwave Measurement Conference (ARFTG)<\/em>, Las Vegas, NV, USA, 2023, pp. 1-4, doi: 10.1109\/ARFTG56062.2023.10148870.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-81n1ma-8f7120bd3cbe72eb4835c1bba7788d33 av_one_fifth  avia-builder-el-59  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><\/div><div class='flex_column av-4t7ixn-f00df4f81b623c8e5a2d3bd31a7e80df av_one_fifth  avia-builder-el-60  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpicv6vr-35964ca4c14ac6648696dccb1becff27\">\n.av_font_icon.av-lpicv6vr-35964ca4c14ac6648696dccb1becff27 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpicv6vr-35964ca4c14ac6648696dccb1becff27 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10148870' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpicveto-6bdc7bb0223d08da19f1037c52a04421 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10148870\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_10'  class='avia-section av-5qnflu-c9eb77df122fd96709567b85f3c5b1eb alternate_color avia-section-large avia-no-shadow  avia-builder-el-63  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-26vdr6-ec702041f08ad9873e8c000581533aac av_three_fifth  avia-builder-el-64  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-kyln6uzh-649ab8ffc3c705f60b9db9cff722f364 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>G. N. Phung, H. Koo, C. Cho, J. Kwon and U. Arz, &#8220;D-Band Characterization of a Commercial High-Resistivity Silicon Calibration Substrate,&#8221;\u00a0<em>2023 101st ARFTG Microwave Measurement Conference (ARFTG)<\/em>, San Diego, CA, USA, 2023, pp. 01-04, doi: 10.1109\/ARFTG57476.2023.10279693.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-4u90v6-3d0c301d737a0f18b6e7bd323b0c7e03 av_one_fifth  avia-builder-el-66  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m20bnot7-eb6b85149d1e37f80e1314fc4dc578e7\">\n.av_font_icon.av-m20bnot7-eb6b85149d1e37f80e1314fc4dc578e7 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m20bnot7-eb6b85149d1e37f80e1314fc4dc578e7 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13902956' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m20bnwjl-f9f796a85a052f9a91b0563c3c52b626 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/records\/10548983\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-340ldn-21367458b1f22e8bd94a0bfd629923d7 av_one_fifth  avia-builder-el-69  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lpicxvvj-e367c28a7c87bc02a753595293881bfd\">\n.av_font_icon.av-lpicxvvj-e367c28a7c87bc02a753595293881bfd .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lpicxvvj-e367c28a7c87bc02a753595293881bfd avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10279693' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lpicy6u6-80c595fd1a8a0867f6537f3e19fc09ef '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10279693\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_11'  class='avia-section av-7oaim3-75e20f28f44dc914789c08559124a8f4 main_color avia-section-large avia-no-shadow  avia-builder-el-72  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-4vh6qz-eb191f169d656117ebb3a961291b2520 av_three_fifth  avia-builder-el-73  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-lu6qr9g3-c241e580a01f60fecd81ff412a8610fd '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>E. Shokrolahzade, F. Sebastiano, F. Mubarak, M. Babaie and M. Spirito, &#8220;Impedance Standard Substrate Characterization and EM model definition for Cryogenic and Quantum-Computing Applications,&#8221;\u00a0<em>2023 IEEE\/MTT-S International Microwave Symposium &#8211; IMS 2023<\/em>, San Diego, CA, USA, 2023, pp. 557-560, doi: 10.1109\/IMS37964.2023.10188097.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-6cjzbv-91dbe3ebfc2b01ee14eafdfd6b397d4d av_one_fifth  avia-builder-el-75  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m21xes6m-f2cc42ce6490d98691233d6e0853a000\">\n.av_font_icon.av-m21xes6m-f2cc42ce6490d98691233d6e0853a000 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m21xes6m-f2cc42ce6490d98691233d6e0853a000 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13907056' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m21xf26q-65aa2ff95acf157b38f06180ddf7c2c7 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13907056\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-37ou6j-db5f72684602625d7267bedc3f3d624a av_one_fifth  avia-builder-el-78  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lu6qrru7-69cbadd97f7824e3502362503d0fd1bf\">\n.av_font_icon.av-lu6qrru7-69cbadd97f7824e3502362503d0fd1bf .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lu6qrru7-69cbadd97f7824e3502362503d0fd1bf avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10188097' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lu6qs0ry-78636bd348665d446d42bde07fbe59a8 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10188097\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_12'  class='avia-section av-djztwb-f5c249dfa8eb5e38b1a67c398681bfcc alternate_color avia-section-large avia-no-shadow  avia-builder-el-81  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-aiu7uj-a04160dccd6e0d4fabfa54069f38e56c av_three_fifth  avia-builder-el-82  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-lylchdnt-8277602be632920002af9bbb06f792ee '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>A. G. Chiariello, G. Di Capua, A. Maffucci and N. Femia, &#8220;Models and Methods for the Analysis of PCB Crosstalk in Switch-Mode Power Supplies,&#8221; <em>2024 IEEE 28th Workshop on Signal and Power Integrity (SPI)<\/em>, Lisbon, Portugal, 2024, pp. 1-4, doi: 10.1109\/SPI60975.2024.10539215.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-cxa563-193ac236b28c6986f9d126ec06880272 av_one_fifth  avia-builder-el-84  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1z2k0vh-d5aeefa8bb2438a2083ce0933de99a13\">\n.av_font_icon.av-m1z2k0vh-d5aeefa8bb2438a2083ce0933de99a13 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1z2k0vh-d5aeefa8bb2438a2083ce0933de99a13 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13898935' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1z2k7ud-e8df8d9e20e25ebf3801355300ac935a '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13898935\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-8isc7v-2e03ca995cd6bf827c62e07a466161f3 av_one_fifth  avia-builder-el-87  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lylci8ft-4544a5b9cea15f49861b7ea7a717b741\">\n.av_font_icon.av-lylci8ft-4544a5b9cea15f49861b7ea7a717b741 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lylci8ft-4544a5b9cea15f49861b7ea7a717b741 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10539215' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lylchzbu-29af6d1a468404cb995045415c21555a '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10539215\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n<\/p>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_13'  class='avia-section av-7tqf2z-c38e462188f71e7386f766e4d52d0e97 main_color avia-section-large avia-no-shadow  avia-builder-el-90  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-69ayd7-cd1d652865c05c88bd241f93db72e75d av_three_fifth  avia-builder-el-91  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-lylcj2id-e90575ed66787d0768014d116d4fb7b7 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>M. Hudli\u010dka and A. Sayegh, &#8220;A Simplified Setup for Passive Intermodulation Measurement,&#8221;\u00a0<em>2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)<\/em>, Glasgow, United Kingdom, 2024, pp. 1-5, doi: 10.1109\/I2MTC60896.2024.10560706.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-1x7u17f-3b28b4906e94ed514b937636f2f5d04d av_one_fifth  avia-builder-el-93  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1gzfq9x-735364280b3f9fed766bd1e9db708847\">\n.av_font_icon.av-m1gzfq9x-735364280b3f9fed766bd1e9db708847 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1gzfq9x-735364280b3f9fed766bd1e9db708847 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.12739673' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-4u9oe3-6cbf6776f4283b1c7b6571b77497bbd9 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.12739673\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-38rui3-bf190714e1fcb9de5554eaf832889b17 av_one_fifth  avia-builder-el-96  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-lylcjm0g-592e75d3d2482bc42ac33b2eb6f44007\">\n.av_font_icon.av-lylcjm0g-592e75d3d2482bc42ac33b2eb6f44007 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-lylcjm0g-592e75d3d2482bc42ac33b2eb6f44007 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10560706' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-lylcjgen-963197110ca830ace2c015d27c82dbb5 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10560706\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_14'  class='avia-section av-6ru6ff-cf714cbadf35242d39e83932e66443db alternate_color avia-section-large avia-no-shadow  avia-builder-el-99  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-1tg0eyz-686f57b2aab36cc83105f21111541c9f av_three_fifth  avia-builder-el-100  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1gzj3hb-663abcc82bdb673d79cdeef122ead9b6 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>D. Singh, M. Salter and N. Ridler, &#8220;Characterisation of Power Transistors for Wireless Network Applications Using Passive and Active Load-Pull,&#8221; <em>2024 IEEE International Symposium on Measurements &#038; Networking (M&#038;N)<\/em>, Rome, Italy, 2024, pp. 1-5, doi: 10.1109\/MN60932.2024.10615466.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-1rdrvjv-14964878bbbbc96cd576d776d4ccfbc7 av_one_fifth  avia-builder-el-102  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1yqbrv4-b1d8f750f708dde5c4aba7c205e6586b\">\n.av_font_icon.av-m1yqbrv4-b1d8f750f708dde5c4aba7c205e6586b .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1yqbrv4-b1d8f750f708dde5c4aba7c205e6586b avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/records\/13867995' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1yqcf9e-2a41b374833f23445f49bb520ab6e3ee '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/records\/13867995\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-1q6rqiz-85f37314c30326a354020d69e7bcce71 av_one_fifth  avia-builder-el-105  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1gzkbp3-4dfb2bf7a9b6711a71d78567538bc5c0\">\n.av_font_icon.av-m1gzkbp3-4dfb2bf7a9b6711a71d78567538bc5c0 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1gzkbp3-4dfb2bf7a9b6711a71d78567538bc5c0 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10615466' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1gzk5tt-10c92d185edc3d26c99dd651c38f2be6 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10615466\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_15'  class='avia-section av-1ompzmz-30a8aa3da9b916ba8dd1a8985555b9dc main_color avia-section-large avia-no-shadow  avia-builder-el-108  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-5wokcb-d1747dbc7e0e9cc46dfa4098f555d8e3 av_three_fifth  avia-builder-el-109  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1gzrm1m-cbde5d4622a7a5bc78ae98efb0bca98e '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>K. Lahbacha\u00a0<em>et al<\/em>., &#8220;Measurement-Based Signal Integrity Analysis of Coupled Thin-Film Microstrip Lines,&#8221;\u00a0<em>2024 IEEE International Symposium on Measurements &#038; Networking (M&#038;N)<\/em>, Rome, Italy, 2024, pp. 1-6, doi: 10.1109\/MN60932.2024.10615657.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-1koclqz-d88c7c5d1ecf172251d915cb2f66c9a6 av_one_fifth  avia-builder-el-111  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1jca4pv-1264713a8f2660046058c90ace7ea6e6\">\n.av_font_icon.av-m1jca4pv-1264713a8f2660046058c90ace7ea6e6 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1jca4pv-1264713a8f2660046058c90ace7ea6e6 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/doi\/10.5281\/zenodo.13838740' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-1zuwmj-bf80c91c17b231e2db088cf0ee7c9dbb '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/doi\/10.5281\/zenodo.13838740\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-1jb5zgr-750e56e6cf0edbeae767744926a7cb81 av_one_fifth  avia-builder-el-114  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1gzryjv-37a69f8d4a96ffa65eed0fe1e247ad74\">\n.av_font_icon.av-m1gzryjv-37a69f8d4a96ffa65eed0fe1e247ad74 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1gzryjv-37a69f8d4a96ffa65eed0fe1e247ad74 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10615657' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1gzs5jw-d573e62cf872bf61692b251154127b23 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10615657\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_16'  class='avia-section av-1icp797-81f2b0c528b68e0d5c52efd241df5378 alternate_color avia-section-large avia-no-shadow  avia-builder-el-117  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-1gb962j-e9085a2216be947ef3ee0f44b896ba2a av_three_fifth  avia-builder-el-118  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1gztrwq-15393e0093d0e0ee4cbbd70fb67fdb3b '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>L. Manning\u00a0<em>et al<\/em>., &#8220;S-Parameter Analysis of Age Testing Effects on FR4-Based Printed Circuit Boards up to 10\u00a0GHz,&#8221;\u00a0<em>2024 IEEE International Symposium on Measurements &#038; Networking (M&#038;N)<\/em>, Rome, Italy, 2024, pp. 1-6, doi: 10.1109\/MN60932.2024.10615784.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-1e1df8r-e5835e1c4cd6482f9b9315dc87e9c7f4 av_one_fifth  avia-builder-el-120  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1yqdgd6-a6e84efd50c25b6fa93567f435ea85c3\">\n.av_font_icon.av-m1yqdgd6-a6e84efd50c25b6fa93567f435ea85c3 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1yqdgd6-a6e84efd50c25b6fa93567f435ea85c3 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13842792' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1yqdtl2-a43c92d1238b06f8c0a789e8c9cf9451 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13842792\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-1ckpmsb-6c91afa081135c31f75a21d8aa5f3d7f av_one_fifth  avia-builder-el-123  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1gzub52-8176b17d3886813cb513581279e9caf7\">\n.av_font_icon.av-m1gzub52-8176b17d3886813cb513581279e9caf7 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1gzub52-8176b17d3886813cb513581279e9caf7 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10615784' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1gzu516-f9b66cf697257b7081726103e65ffb54 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10615784\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_17'  class='avia-section av-4nnrkr-cf533d13313194e38ee02f43d297dbde main_color avia-section-large avia-no-shadow  avia-builder-el-126  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-18yzpi3-f546d3f9d6de51794c93467a02688b78 av_three_fifth  avia-builder-el-127  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1gzvubh-06dbaaf52611a5cd42042dc6b89e14b7 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>A. Sayegh, N. Meyne and T. Kleine-Ostmann, &#8220;Measurement of Passive Intermodulation with Uncertainty Budget using a Vectorial-PIM System,&#8221;\u00a0<em>2024 IEEE International Symposium on Measurements &#038; Networking (M&#038;N)<\/em>, Rome, Italy, 2024, pp. 1-6, doi: 10.1109\/MN60932.2024.10615764.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-17tq5kb-9679b890eb5e7056bbfcb38e2fe3c103 av_one_fifth  avia-builder-el-129  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1jcbu6f-21d4beb24a763a3bea10cc8b520c1349\">\n.av_font_icon.av-m1jcbu6f-21d4beb24a763a3bea10cc8b520c1349 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1jcbu6f-21d4beb24a763a3bea10cc8b520c1349 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/doi\/10.5281\/zenodo.13838960' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1gzg13p-c1aa8903a7c0d6446cf7e6345b74dcdb '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/doi\/10.5281\/zenodo.13838960\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-492fjf-b3f37871a9e4681efe1f4f337adcb7d9 av_one_fifth  avia-builder-el-132  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1gzy017-eb280230a394d798fde56d3ab31e31ce\">\n.av_font_icon.av-m1gzy017-eb280230a394d798fde56d3ab31e31ce .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1gzy017-eb280230a394d798fde56d3ab31e31ce avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10615764' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1gzxiwx-662efb3cb58b86481a6365c0da203552 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10615764\" data-wplink-edit=\"true\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_18'  class='avia-section av-14lurt7-a478c1efa5ea807f931648537532f46f alternate_color avia-section-large avia-no-shadow  avia-builder-el-135  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-12i77yz-9847ab5a3fd33eabff4e4c5e068df66f av_three_fifth  avia-builder-el-136  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1h01upw-83e0644206ac98d53a89ff4c329f69ee '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>D. Allal, A. Sayegh and F. Rausche, &#8220;S-Parameter Bilateral Comparison in 4.3-10 Coaxial Line,&#8221;\u00a0<em>2024 Conference on Precision Electromagnetic Measurements (CPEM)<\/em>, Denver, CO, USA, 2024, pp. 1-2, doi: 10.1109\/CPEM61406.2024.10645995.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-3shicb-0062e08270455b688b52024f07b38e5e av_one_fifth  avia-builder-el-138  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1jcdzpo-c69dd1affe890f3c102e03c99c84d4e8\">\n.av_font_icon.av-m1jcdzpo-c69dd1affe890f3c102e03c99c84d4e8 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1jcdzpo-c69dd1affe890f3c102e03c99c84d4e8 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/zenodo.org\/doi\/10.5281\/zenodo.13838895' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1jce9ks-582badb24883687147367b7d3ece718d '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/zenodo.org\/doi\/10.5281\/zenodo.13838895\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-zc7crv-23dbbe3b461277baa88451662f0f4e6e av_one_fifth  avia-builder-el-141  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1h02egi-f85b4ea4ad69bf63176f9d3a676ebfe9\">\n.av_font_icon.av-m1h02egi-f85b4ea4ad69bf63176f9d3a676ebfe9 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1h02egi-f85b4ea4ad69bf63176f9d3a676ebfe9 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10645995' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1h028q5-f694e6987f8e1c9fbfb80ef189120391 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10645995\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_19'  class='avia-section av-y1kgyj-cd5d2ea6fc50c30661a7761d6ad623a0 main_color avia-section-large avia-no-shadow  avia-builder-el-144  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-w4b45n-e0d6062f5aaaeee515e2793018cea4f7 av_three_fifth  avia-builder-el-145  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1h04th4-a70d90651264d971f9046b2f084dc994 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>E. Shokrolahzade, C. De Martino and M. Spirito, &#8220;Reduced Calibration Error Employing Parametrized EM models and DC Load Extraction,&#8221;\u00a0<em>2023 100th ARFTG Microwave Measurement Conference (ARFTG)<\/em>, Las Vegas, NV, USA, 2023, pp. 1-4, doi: 10.1109\/ARFTG56062.2023.10148882.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-uf3r63-48bb0d6c50d052d26d33ef04568980e5 av_one_fifth  avia-builder-el-147  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m21xg6tm-78f618dd78e7fc021045091ee65199ea\">\n.av_font_icon.av-m21xg6tm-78f618dd78e7fc021045091ee65199ea .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m21xg6tm-78f618dd78e7fc021045091ee65199ea avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13907072' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m21xgxm7-e399a3d6118ce85356a6c6cb0a79e2b7 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13907072\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-ti31yj-328ab5239f460c82eaf259eb73d98d9a av_one_fifth  avia-builder-el-150  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1h05526-6fcc9e88a4fd89e11d019c80effd8579\">\n.av_font_icon.av-m1h05526-6fcc9e88a4fd89e11d019c80effd8579 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1h05526-6fcc9e88a4fd89e11d019c80effd8579 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10148882' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1h05hh1-b54328d79b447fdd2057377de4629d67 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10615764\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_20'  class='avia-section av-s0bebf-181c2f935b1818911969dfd1b3a874bb alternate_color avia-section-large avia-no-shadow  avia-builder-el-153  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-poufaz-3dae0cbc3e0c9c8924adb3af7e15425c av_three_fifth  avia-builder-el-154  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1h072o3-d395d1df11f97b627ca69434b0d1c037 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>B. Louwes, M. J. Pelk, J. Bueno, E. Shokrolahzade, C. De Martino and M. Spirito, &#8220;A Fast High Sensitivity Power Transfer Device Approach for (sub)mm-wave applications,&#8221;\u00a0<em>2024 103rd ARFTG Microwave Measurement Conference (ARFTG)<\/em>, Washington, DC, USA, 2024, pp. 1-3, doi: 10.1109\/ARFTG61196.2024.10661083.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-ngu717-0f9ac2e5fac82318c1efbcf241aa7df0 av_one_fifth  avia-builder-el-156  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m21xqy0y-e9fb20192efad016cf989eb525143d7a\">\n.av_font_icon.av-m21xqy0y-e9fb20192efad016cf989eb525143d7a .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m21xqy0y-e9fb20192efad016cf989eb525143d7a avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13907609' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m21xr4wg-bd517a1f5f5cd69984a9b408a62fc9a4 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13907609\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-ltyn0r-17a8723a6c5e01f5783a21641d8ca1ca av_one_fifth  avia-builder-el-159  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1h07fud-5a646b62b81044761dc9192a2640ef8b\">\n.av_font_icon.av-m1h07fud-5a646b62b81044761dc9192a2640ef8b .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1h07fud-5a646b62b81044761dc9192a2640ef8b avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10661083' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1h07m4k-60ea6423e749919acaa8e9b350f21ea8 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10661083\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div><\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_21'  class='avia-section av-24iauz-7e3c065f5ad5daa733d4fc3ab62a1664 main_color avia-section-large avia-no-shadow  avia-builder-el-162  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-iwb20b-783a46db1a23442ac076543ff01120d6 av_three_fifth  avia-builder-el-163  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1h09wt8-317f6261221c3237724f8be5a17b3f92 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>T. D. Pham\u00a0<em>et al<\/em>., &#8220;Measurement and Analysis of On-Wafer Test Structures for Signal Integrity Assessment at Chip Level,&#8221;\u00a0<em>2024 Conference on Precision Electromagnetic Measurements (CPEM)<\/em>, Denver, CO, USA, 2024, pp. 1-2, doi: 10.1109\/CPEM61406.2024.10646002.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-h1l7yj-9a829b2d365c0dbb699cca3fa867621a av_one_fifth  avia-builder-el-165  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1yqfi0r-3c631e12b1e9f5a8f872008dc09d7484\">\n.av_font_icon.av-m1yqfi0r-3c631e12b1e9f5a8f872008dc09d7484 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1yqfi0r-3c631e12b1e9f5a8f872008dc09d7484 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13838882' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1yqfqho-7a9443955743a11cf88624f3575350cb '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13838882\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-1ivu63-3efcb5bbb1db3d96486cee6011e9763d av_one_fifth  avia-builder-el-168  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1h0a9jk-0be646020354c179ce594254dd58b7f9\">\n.av_font_icon.av-m1h0a9jk-0be646020354c179ce594254dd58b7f9 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1h0a9jk-0be646020354c179ce594254dd58b7f9 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10646002' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1h0aftz-2d5a32d50a759fdea1da04c68ef7dc6c '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10646002\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n<\/p>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_22'  class='avia-section av-eruu17-3c39d8ebd4d23b8c4eaccb0569818e0f alternate_color avia-section-large avia-no-shadow  avia-builder-el-171  el_after_av_section  el_before_av_section  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-cemf2j-af057debfaff269f046003afc8ca82d6 av_three_fifth  avia-builder-el-172  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1h0bqng-6c0fb52645e12b8d1b6144c0b666c50f '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>L. Manning, A. Robador and J. Skinner, &#8220;Temperature Humidity Bias Testing of a Wafer-Embedded Coplanar Waveguide Line up to 40 GHz,&#8221;\u00a0<em>2024 103rd ARFTG Microwave Measurement Conference (ARFTG)<\/em>, Washington, DC, USA, 2024, pp. 1-4, doi: 10.1109\/ARFTG61196.2024.10660883.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-12376z-693e644e79547e66c522e23aabb9f2ad av_one_fifth  avia-builder-el-174  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1z1bx04-144381261cc8bc507401397981c73902\">\n.av_font_icon.av-m1z1bx04-144381261cc8bc507401397981c73902 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1z1bx04-144381261cc8bc507401397981c73902 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13850634' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1z1c7z3-e5615a47ad1e88feb674873755e5011e '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13850634\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-995ubf-bc35e2a9444016ea748af5fe0478325d av_one_fifth  avia-builder-el-177  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1h0c35m-98a46e5cac35704b397e6e932d4a91d2\">\n.av_font_icon.av-m1h0c35m-98a46e5cac35704b397e6e932d4a91d2 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1h0c35m-98a46e5cac35704b397e6e932d4a91d2 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10660883' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1h0cdq5-b608560f0c380b98645a3622444179a0 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10660883\" target=\"_blank\" rel=\"noopener\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='av_section_23'  class='avia-section av-soju3-b65b20e875392b6583b613e4125ec2b9 main_color avia-section-large avia-no-shadow  avia-builder-el-180  el_after_av_section  avia-builder-el-last  avia-bg-style-scroll  container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n<div class='flex_column av-6dsrzf-9e3be3b391592153dc9d776fa5af0313 av_three_fifth  avia-builder-el-181  el_before_av_one_fifth  avia-builder-el-first  first flex_column_div '   ><section  id=\"need\"  class='av_textblock_section av-m1h0eadf-a709d1f9b147b63f48c7a78b980c8bf5 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><h3>D. Poduval, F. A. Mu\u00f1oz, G. Rietveld and F. A. Mubarak, &#8220;Evaluating Aging Uncertainty of Impedance Standard Substrate in On-wafer S-parameter Measurements,&#8221;\u00a0<em>2024 Conference on Precision Electromagnetic Measurements (CPEM)<\/em>, Denver, CO, USA, 2024, pp. 1-2, doi: 10.1109\/CPEM61406.2024.10646142.<\/h3>\n<\/div><\/section><\/div><div class='flex_column av-43wlq3-2eba68624e16bb9214a1d3315413b421 av_one_fifth  avia-builder-el-183  el_after_av_three_fifth  el_before_av_one_fifth  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1yqgzbu-ca3301a0cc341c00bca158c866c854f7\">\n.av_font_icon.av-m1yqgzbu-ca3301a0cc341c00bca158c866c854f7 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1yqgzbu-ca3301a0cc341c00bca158c866c854f7 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/doi.org\/10.5281\/zenodo.13897041' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84d' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1yqh905-95fc9bdfbb0c3fe04012090c47448e0e '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/doi.org\/10.5281\/zenodo.13897041\" target=\"_blank\" rel=\"noopener\">open-access version<\/a><\/p>\n<\/div><\/section><\/p><\/div><div class='flex_column av-2utvij-f7b8e24f8f8a6938d1f8db73c048158b av_one_fifth  avia-builder-el-186  el_after_av_one_fifth  avia-builder-el-last  flex_column_div '   ><p>\n<style type=\"text\/css\" data-created_by=\"avia_inline_auto\" id=\"style-css-av-m1h0el1z-d95e518c7a09556eb845be75814bf703\">\n.av_font_icon.av-m1h0el1z-d95e518c7a09556eb845be75814bf703 .av-icon-char{\nfont-size:40px;\nline-height:40px;\n}\n<\/style>\n<span  class=\"av_font_icon av-m1h0el1z-d95e518c7a09556eb845be75814bf703 avia_animate_when_visible av-icon-style- avia-icon-pos-center av-no-color avia-icon-animate \"><a href='https:\/\/ieeexplore.ieee.org\/document\/10646142' target=\"_blank\" rel=\"noopener noreferrer\" class='av-icon-char' aria-hidden='true' data-av_icon='\ue84e' data-av_iconfont='entypo-fontello'><\/a><\/span><br \/>\n<section  class='av_textblock_section av-m1h0er2u-3b5eab06851cf6c29c832f1afaa0c6a0 '  itemscope=\"itemscope\" itemtype=\"https:\/\/schema.org\/CreativeWork\" ><div class='avia_textblock '  itemprop=\"text\" ><p style=\"text-align: center;\"><a href=\"https:\/\/ieeexplore.ieee.org\/document\/10646142\">publisher version<\/a><\/p>\n<\/div><\/section><\/p><\/div>\n<\/div><\/div><\/div><!-- close content main div --><\/div><\/div><div id='after_section_23'  class='main_color av_default_container_wrap container_wrap sidebar_right'  ><div class='container av-section-cont-open' ><div class='template-page content  av-content-small alpha units'><div class='post-entry post-entry-type-page post-entry-4699'><div class='entry-content-wrapper clearfix'>\n","protected":false},"excerpt":{"rendered":"","protected":false},"author":3,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-4699","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages\/4699","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=4699"}],"version-history":[{"count":47,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages\/4699\/revisions"}],"predecessor-version":[{"id":4888,"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=\/wp\/v2\/pages\/4699\/revisions\/4888"}],"wp:attachment":[{"href":"https:\/\/futurecom.unicas.it\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=4699"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}